검색결과 : 19건
| No. | Article |
|---|---|
| 1 |
Estimating depolarization with the Jones matrix quality factor Hilfiker JN, Hale JS, Herzinger CM, Tiwald T, Hong N, Schoche S, Arwin H Applied Surface Science, 421, 494, 2017 |
| 2 |
Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry Hofmann T, Knight S, Sekora D, Schmidt D, Herzinger CM, Woollam JA, Schubert E, Schubert M Applied Surface Science, 421, 513, 2017 |
| 3 |
Optical constants of electroplated gold from spectroscopic ellipsometry Synowicki RA, Herzinger CM, Hall JT, Malingowski A Applied Surface Science, 421, 824, 2017 |
| 4 |
Terahertz ellipsometry and terahertz optical-Hall effect Hofmann T, Herzinger CM, Tedesco JL, Gaskill DK, Woollam JA, Schubert M Thin Solid Films, 519(9), 2593, 2011 |
| 5 |
Terahertz optical-Hall effect for multiple valley band materials: n-type silicon Kuhne P, Hofmann T, Herzinger CM, Schubert M Thin Solid Films, 519(9), 2613, 2011 |
| 6 |
Fluid refractive index measurements using rough surface and prism minimum deviation techniques Synowicki RA, Pribil GK, Cooney G, Herzinger CM, Green SE, French RH, Yang MK, Burnett JH, Kaplan S Journal of Vacuum Science & Technology B, 22(6), 3450, 2004 |
| 7 |
Precision in ellipsometrically determined sample parameters: simulation and experiment Johs B, Herzinger CM Thin Solid Films, 455-56, 66, 2004 |
| 8 |
UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 <= x <= 0.53) thin films Schmidt-Grund R, Schubert M, Rheinlander B, Fritsch D, Schmidt H, Kaidashev EM, Lorenz M, Herzinger CM, Grundmann M Thin Solid Films, 455-56, 500, 2004 |
| 9 |
Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures Schubert M, Hofmann T, Herzinger CM Thin Solid Films, 455-56, 563, 2004 |
| 10 |
Mueller-matrix characterization of liquid crystals Hilfiker JN, Herzinger CM, Wagner T, Marino A, Delgais G, Abbate G Thin Solid Films, 455-56, 591, 2004 |