검색결과 : 26건
No. | Article |
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1 |
Near-Sun observations of an F-corona decrease and K-corona fine structure Howard RA, Vourlidas A, Bothmer V, Colaninno RC, DeForest CE, Gallagher B, Hall JR, Hess P, Higginson AK, Korendyke CM, Kouloumvakos A, Lamy PL, Liewer PC, Linker J, Linton M, Penteado P, Plunkett SP, Poirier N, Raouafi NE, Rich N, Rochus P, Rouillard AP, Socker DG, Stenborg G, Thernisien AF, Viall NM Nature, 576(7786), 232, 2019 |
2 |
Cleavage of silicon by laser-based shock waves: Interpretation by nanoscopic length scales Hess P, Lomonosov AM Applied Surface Science, 302, 58, 2014 |
3 |
High Piezoelectric Longitudinal Coefficients in Sol-gel PZT Thin Film Multilayers Balma D, Mazzalai A, Chidambaram N, Sandu CS, Neels A, Dommann A, Hess P, Binz D, Muralt P Journal of the American Ceramic Society, 97(7), 2069, 2014 |
4 |
Cardiac angiogenic imbalance leads to peripartum cardiomyopathy Patten IS, Rana S, Shahul S, Rowe GC, Jang C, Liu L, Hacker MR, Rhee JS, Mitchell J, Mahmood F, Hess P, Farrell C, Koulisis N, Khankin EV, Burke SD, Tudorache I, Bauersachs J, del Monte F, Hilfiker-Kleiner D, Karumanchi SA, Arany Z Nature, 485(7398), 333, 2012 |
5 |
Controlled stepwise growth of siloxane chains using bivalent building units with different functionalities Salingue N, Lingenfelser D, Prunici P, Hess P Thin Solid Films, 518(19), 5535, 2010 |
6 |
Stability and fragmentation of organic silicon functionalizations studied by laser desorption mass spectrometry Lingenfelser D, Hess P Applied Surface Science, 253(15), 6563, 2007 |
7 |
Laser-induced thermal desorption mass spectrometry of functionalized silicon surfaces Lingenfelser D, Hess P Applied Surface Science, 253(19), 7749, 2007 |
8 |
Optimization of the incident angle in infrared spectroscopic ellipsometry: Spectra of C-18-alkylthiol monolayers Hu ZG, Hess P Journal of Vacuum Science & Technology A, 25(3), 601, 2007 |
9 |
Infrared spectroscopic ellipsometry of n-alkylthiol (C-5-C-18) self-assembled monolayers on gold Hu ZG, Prunici P, Patzner P, Hess P Journal of Physical Chemistry B, 110(30), 14824, 2006 |
10 |
Real-time analysis of UV laser-induced growth of ultrathin oxide films on silicon by spectroscopic ellipsometry Patzner P, Osipov AV, Hess P Applied Surface Science, 247(1-4), 204, 2005 |