검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Performance and reliability of HfAlOx-based interpoly dielectrics for floating-gate Flash memory Govoreanu B, Wellekens D, Haspeslagh L, Brunco DP, De Vos J, Aguado DR, Blomme P, van der Zanden K, Van Houdt J Solid-State Electronics, 52(4), 557, 2008 |
| 2 |
Crystallization process of high-k gate dielectrics studied by surface X-ray diffraction Terasawa N, Akimoto K, Mizuno Y, Ichimiya A, Sumitani K, Takahashi T, Zhang XW, Sugiyama H, Kawata H, Nabatame T, Toriumi A Applied Surface Science, 244(1-4), 16, 2005 |