검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of HfO2/Si(001) interface with high-resolution Rutherford backscattering spectroscopy Nakajima K, Joumori S, Suzuki M, Kimura K, Osipowicz T, Tok KL, Zheng JZ, See A, Zhang BC Applied Surface Science, 237(1-4), 416, 2004 |