검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Charge trapping in HfO2 and HfSiO4 MOS gate dielectrics Chang KW, Chang FM, Ruzyllo J Solid-State Electronics, 50(9-10), 1670, 2006 |
| 2 |
Growth and thermal annealing of Cu on HfSiO4 Park HJ, Sun YM, Lozano J, White JM Applied Surface Science, 201(1-4), 171, 2002 |