화학공학소재연구정보센터
검색결과 : 47건
No. Article
1 Effect of reactant gas stoichiometry of in-situ SiNx passivation on structural properties of MOCVD AlGaN/GaN HEMTs
Siddique A, Ahmed R, Anderson J, Piner EL
Journal of Crystal Growth, 517, 28, 2019
2 Ohmic contact to AlGaN/GaN HEMT with electrodes in contact with heterostructure interface
Chen DB, Wan LJ, Li J, Liu ZK, Li GQ
Solid-State Electronics, 151, 60, 2019
3 Device behaviour and zero temperature coefficients analysis for microwave GaAs HEMT
Alim MA, Rezazadeh AA
Solid-State Electronics, 147, 13, 2018
4 Mechanism of leakage of ion-implantation isolated AlGaN/GaN MIS-high electron mobility transistors on Si substrate
Zhang ZL, Song L, Li WY, Fu K, Yu GH, Zhang XD, Fan YM, Deng XG, Li SM, Sun SC, Li XJ, Yuan J, Sun Q, Dong ZH, Cai Y, Zhang BS
Solid-State Electronics, 134, 39, 2017
5 The causes of GaN HEMT bell-shaped transconductance degradation
Chen CH, Sadler R, Wang DV, Hou D, Yang YF, Yau W, Sutton W, Shim J, Wang SG, Duong A
Solid-State Electronics, 126, 115, 2016
6 Low temperature AIN growth by MBE and its application in HEMTs
Faria FA, Nomoto K, Hu ZY, Rouvimov S, Xing HL, Jena D
Journal of Crystal Growth, 425, 133, 2015
7 Influence of a parallel electric field on the dispersion relation of graphene - A new route to Dirac logics
Krukowski S, Soltys J, Borysiuk J, Piechota J
Journal of Crystal Growth, 401, 869, 2014
8 A novel method for measuring parasitic resistance in high electron mobility transistors
Yang Z, Wang JY, Li XP, Zhang B, Zhao J, Xu Z, Wang MJ, Yu M, Yang ZC, Wu WG, Zhang YM, Zhang JC, Ma XH, Hao Y
Solid-State Electronics, 100, 27, 2014
9 Nano-scale surface morphology optimization of the ohmic contacts and electrical properties of AlGaN/GaN high electron mobility transistors using a rapid thermal annealing dielectric protection layer
Cho SJ, Wang C, Kim NY
Thin Solid Films, 557, 262, 2014
10 True planar InAs/AlSb HEMTs with ion-implantation technique for low-power cryogenic applications
Moschetti G, Abbasi M, Nilsson PA, Hallen A, Desplanque L, Wallart X, Grahn J
Solid-State Electronics, 79, 268, 2013