검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
High resolution Rutherford Backscattering Spectrometry investigations of ZrO2 layer growth in the initial stage on native silicon oxide and titanium nitride Vieluf M, Munnik F, Neelmeijer C, Kosmata M, Teichert S Thin Solid Films, 520(18), 5900, 2012 |
| 2 |
Exit angle dependence of charge-state distribution of backscattered He ions Sasakawa K, Nakajima K, Suzuki M, Kimura K Applied Surface Science, 256(4), 965, 2009 |
| 3 |
Compositional transition layer in SiO2/Si interface observed by high-resolution RBS Kimura K, Nakajima K Applied Surface Science, 216(1-4), 283, 2003 |