화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers
Esfeh BK, Makovejev S, Basso D, Desbonnets E, Kilchytska V, Flandre D, Raskin JP
Solid-State Electronics, 128, 121, 2017
2 Advanced Si-based substrates for RF passive integration: Comparison between local porous Si layer technology and trap-rich high resistivity Si
Sarafis P, Hourdakis E, Nassiopoulou AG, Neve CR, Ben Ali K, Raskin JP
Solid-State Electronics, 87, 27, 2013
3 Schottky diode back contacts for high frequency capacitance studies on semiconductors
Mallik K, Falster RJ, Wilshaw PR
Solid-State Electronics, 48(2), 231, 2004