검색결과 : 20건
| No. | Article |
|---|---|
| 1 |
Role of H-2 supply for Sn incorporations in MOCVD Ge1-xSnx epitaxial growth Suda K, Sawamoto N, Machida H, Ishikawa M, Sudoh H, Ohshita Y, Hirosawa I, Ogura A Journal of Crystal Growth, 468, 605, 2017 |
| 2 |
The effect of air exposure on the crystal structure of oligo-thiophene thin films investigated using in situ X-ray diffraction Watanabe T, Koganezawa T, Kikuchi M, Videlot-Ackermann C, Ackermann J, Brisset H, Yoshimoto N, Hirosawa I Journal of Crystal Growth, 468, 816, 2017 |
| 3 |
Molecular alignments of sigma phase in co-evaporated pentacene and perfluoropentacne film on SiO2 studied by grazing-incidence X-ray diffraction Hirosawa I, Watanabe T, Koganesawa T, Tada K, Yoshimoto N Molecular Crystals and Liquid Crystals, 654(1), 47, 2017 |
| 4 |
A new instrumentation for in situ characterization of the charge transport and crystallographic properties in co-evaporated organic thin film transistor Watanabe T, Kikuchi M, Nishida K, Koganezawa T, Hirosawa I, Yoshimoto N Molecular Crystals and Liquid Crystals, 636(1), 168, 2016 |
| 5 |
Microstructures of BPDA-PPD polyimide thin films with different thicknesses Kotera M, Samyul B, Araie K, Sugioka Y, Nishino T, Maji S, Noda M, Senoo K, Koganezawa T, Hirosawa I Polymer, 54(9), 2435, 2013 |
| 6 |
Grazing incidence X-ray diffraction study on carbon nanowalls Yoshimura H, Yamada S, Yoshimura A, Hirosawa I, Kojima K, Tachibana M Chemical Physics Letters, 482(1-3), 125, 2009 |
| 7 |
Evaluation and Control of Strain in Si Induced by Patterned SiN Stressor Ogura A, Saitoh H, Kosemura D, Kakemura Y, Yoshida T, Takei M, Koganezawa T, Hirosawa I, Kohno M, Nishita T, Nakanishi T Electrochemical and Solid State Letters, 12(4), H117, 2009 |
| 8 |
Evaluation of super-critical thickness strained-Si on insulator (sc-SSOI) substrate Ogura A, Yoshida T, Kosemura D, Kakemura Y, Takei M, Saito H, Shimura T, Koganesawa T, Hirosawa I Solid-State Electronics, 52(12), 1845, 2008 |
| 9 |
A structural study of amorphous In2O3-ZnO films by grazing incidence X-ray scattering (GIXS) with synchrotron radiation Utsuno F, Inoue H, Shimane Y, Shibuya T, Yano K, Inoue K, Hirosawa I, Sato M, Honma T Thin Solid Films, 516(17), 5818, 2008 |
| 10 |
Measurement of in-plane and depth strain profiles in strained-Si substrates Ogura A, Kosemura D, Yamasaki K, Tanaka S, Kakemura Y, Kitano A, Hirosawa I Solid-State Electronics, 51(2), 219, 2007 |