화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 45 nm hp line/space patterning into a thin spin coat film by UV nanoimprint based on condensation
Hiroshima H, Wang Q, Youn SW
Journal of Vacuum Science & Technology B, 28(6), C6M12, 2010
2 Residual layer uniformity using complementary patterns to compensate for pattern density variation in UV nanoimprint lithography
Wang Q, Hiroshima H, Atobe H, Youn SW
Journal of Vacuum Science & Technology B, 28(6), C6M125, 2010
3 Release force reduction in UV nanoimprint by mold orientation control and by gas environment
Hiroshima H
Journal of Vacuum Science & Technology B, 27(6), 2862, 2009
4 Numerical study on bubble trapping in UV nanoimprint lithography
Morihara D, Nagaoka Y, Hiroshima H, Hirai Y
Journal of Vacuum Science & Technology B, 27(6), 2866, 2009
5 UV-nanoimprint with the assistance of gas condensation at atmospheric environmental pressure
Hiroshima H, Komuro M
Journal of Vacuum Science & Technology B, 25(6), 2333, 2007
6 Fabrication of trilayer resist using photocuring-imprint lithography
Kim SH, Hiroshima H, Inoue S, Kurashima Y, Komuro M
Journal of Vacuum Science & Technology B, 21(6), 3144, 2003
7 Room temperature replication in spin on glass by nanoimprint technology
Matsui S, Igaku Y, Ishigaki H, Fujita J, Ishida M, Ochiai Y, Komuro M, Hiroshima H
Journal of Vacuum Science & Technology B, 19(6), 2801, 2001
8 Fabrication technology of a Si nanowire memory transistor using an inorganic electron beam resist process
Tsutsumi T, Ishii K, Hiroshima H, Hazra S, Yamanaka M, Sakata I, Taguchi H, Suzuki E, Tomizawa K
Journal of Vacuum Science & Technology B, 18(6), 2640, 2000
9 The use of a Si-based resist system and Ti electrode for the fabrication of sub-10 nm metal-insulator-metal tunnel junctions
Wada T, Haraichi S, Ishii K, Hiroshima H, Komuro M, Gorwadkar SM
Journal of Vacuum Science & Technology A, 16(3), 1430, 1998
10 Electron-Beam Dot Lithography for Nanometer-Scale Tunnel-Junctions Using a Double-Layered Inorganic Resist
Haraichi S, Wada T, Gorwadkar SM, Ishii K, Hiroshima H
Journal of Vacuum Science & Technology B, 15(4), 1406, 1997