검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Characterization of Si and CVD SiC to glass anodic bonding using TEM and STEM analysis Tudryn C, Schweizer S, Hopkins R, Hobbs L, Garratt-Reed AJ Journal of the Electrochemical Society, 152(4), E131, 2005 |
| 2 |
Optical breakdown of InGaAsP/InP based multiquantum well optical attenuators Boudreau M, Yan J, Hobbs L Journal of Vacuum Science & Technology A, 18(2), 574, 2000 |
| 3 |
Failure analysis of high power GaAs-based lasers using electron beam induced current analysis and transmission electron microscopy Mallard RE, Clayton R, Mayer D, Hobbs L Journal of Vacuum Science & Technology A, 16(2), 825, 1998 |