1 |
Fast and slow interface traps in transparent NiO gated AlGaN/GaN heterostructure field-effect transistors Li LA, Chen J, Liu ZX, Que TT, Gu X, He L, Liu Y Applied Surface Science, 475, 1043, 2019 |
2 |
Enhanced gate-bias stress stability of organic field-effect transistors by introducing a fluorinated polymer in semiconductor/insulator ternary blends Jeong YJ, Yun DJ, Nam S, Jang J Applied Surface Science, 481, 642, 2019 |
3 |
Bi quantum dots on rutile TiO2 as hole trapping centers for efficient photocatalytic bromate reduction under visible light illumination Xiao J, Yang WY, Li Q Applied Catalysis B: Environmental, 218, 111, 2017 |
4 |
Interfacial carrier dynamics in PbS-ZnO light harvesting assemblies and their potential implication in photovoltaic/photocatalysis application Sardar S, Kar P, Sarkar S, Lemmens P, Pal SK Solar Energy Materials and Solar Cells, 134, 400, 2015 |
5 |
Percolation conductivity in BaZrO3-BaFeO3 solid solutions Kim D, Miyoshi S, Tsuchiya T, Yamaguchi S Solid State Ionics, 262, 875, 2014 |
6 |
Effects of electron blocking and hole trapping of the red guest emitter materials on hybrid white organic light emitting diodes Hong LA, Vu HT, Juang FS, Lai YJ, Yeh PH, Tsai YS Thin Solid Films, 544, 59, 2013 |
7 |
EPR studies of electron and hole trapping in titania photocatalysts Macdonald IR, Rhydderch S, Holt E, Grant N, Storey JMD, Howe RF Catalysis Today, 182(1), 39, 2012 |
8 |
Recombination processes in dye-sensitized solid-state solar cells with CuI as the hole collector Perera VPS, Tennakone K Solar Energy Materials and Solar Cells, 79(2), 249, 2003 |
9 |
Isotope effect of hydrogen release in metal/oxide/n-silicon tunneling diodes Lin CH, Yuan F, Hsu BC, Liu CW Solid-State Electronics, 47(6), 1123, 2003 |
10 |
Hydrogen-related hole capture and positive charge build up in buried oxides Rivera A, van Veen A, Schut H, de Nijs JMM, Balk P Solid-State Electronics, 46(11), 1775, 2002 |