화학공학소재연구정보센터
검색결과 : 21건
No. Article
1 Time-Resolved Morphology and Kinetic Studies of Pulsed Laser Deposition-Grown Pt Layers on Sapphire at Different Growth Temperatures by in Situ Grazing Incidence Small-Angle X-ray Scattering
Bauer S, Rodrigues A, Horak L, Nergis B, Jin XW, Schneider R, Groger R, Baumbach T, Holy V
Langmuir, 37(2), 734, 2021
2 SrAl12O19 thin films by chemical solution deposition and their use as buffer layers for oriented growth of hexagonal ferrites
Bursik J, Uhrecky R, Kascakova D, Kuzel R, Holy V, Dopita M
Thin Solid Films, 616, 228, 2016
3 Single crystal growth of TIMETAL LCB titanium alloy by a floating zone method
Smilauerova J, Pospisil J, Harcuba P, Holy V, Janecek M
Journal of Crystal Growth, 405, 92, 2014
4 Fe2O3/TiO2 nanoparticles-a complex structural study
Vales V, Buljan M, Janicki V, Bernstorff S, Mangold S, Siketic Z, Schneeweiss O, Holy V
Thin Solid Films, 564, 65, 2014
5 Structural and morphological properties of Fe2O3/TiO2 nanocrystals in silica matrix
Vales V, Holy V, Buljan M, Janicki V, Bernstorff S
Thin Solid Films, 520(14), 4800, 2012
6 Molecular beam epitaxy of LiMnAs
Novak V, Cukr M, Soban Z, Jungwirth T, Marti X, Holy V, Horodyska P, Nemec P
Journal of Crystal Growth, 323(1), 348, 2011
7 A spin-valve-like magnetoresistance of an antiferromagnet-based tunnel junction
Park BG, Wunderlich J, Marti X, Holy V, Kurosaki Y, Yamada M, Yamamoto H, Nishide A, Hayakawa J, Takahashi H, Shick AB, Jungwirth T
Nature Materials, 10(5), 347, 2011
8 Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
Holy V, Mundboth K, Mokuta C, Metzger TH, Stangl J, Bauer G, Boeck T, Schmidbauer M
Thin Solid Films, 516(22), 8022, 2008
9 Composition and atomic ordering of Ge/Si(001) wetting layers
Malachias A, Metzger TH, Stoffel M, Schmidt OG, Holy V
Thin Solid Films, 515(14), 5587, 2007
10 Changes in the shapes of self-organized PbSe quantum dots during PbEuTe overgrowth investigated by anomalous X-ray diffraction
Holy V, Schulli TU, Lechner RT, Springholz G, Bauer G
Applied Surface Science, 253(1), 177, 2006