검색결과 : 21건
No. | Article |
---|---|
1 |
Time-Resolved Morphology and Kinetic Studies of Pulsed Laser Deposition-Grown Pt Layers on Sapphire at Different Growth Temperatures by in Situ Grazing Incidence Small-Angle X-ray Scattering Bauer S, Rodrigues A, Horak L, Nergis B, Jin XW, Schneider R, Groger R, Baumbach T, Holy V Langmuir, 37(2), 734, 2021 |
2 |
SrAl12O19 thin films by chemical solution deposition and their use as buffer layers for oriented growth of hexagonal ferrites Bursik J, Uhrecky R, Kascakova D, Kuzel R, Holy V, Dopita M Thin Solid Films, 616, 228, 2016 |
3 |
Single crystal growth of TIMETAL LCB titanium alloy by a floating zone method Smilauerova J, Pospisil J, Harcuba P, Holy V, Janecek M Journal of Crystal Growth, 405, 92, 2014 |
4 |
Fe2O3/TiO2 nanoparticles-a complex structural study Vales V, Buljan M, Janicki V, Bernstorff S, Mangold S, Siketic Z, Schneeweiss O, Holy V Thin Solid Films, 564, 65, 2014 |
5 |
Structural and morphological properties of Fe2O3/TiO2 nanocrystals in silica matrix Vales V, Holy V, Buljan M, Janicki V, Bernstorff S Thin Solid Films, 520(14), 4800, 2012 |
6 |
Molecular beam epitaxy of LiMnAs Novak V, Cukr M, Soban Z, Jungwirth T, Marti X, Holy V, Horodyska P, Nemec P Journal of Crystal Growth, 323(1), 348, 2011 |
7 |
A spin-valve-like magnetoresistance of an antiferromagnet-based tunnel junction Park BG, Wunderlich J, Marti X, Holy V, Kurosaki Y, Yamada M, Yamamoto H, Nishide A, Hayakawa J, Takahashi H, Shick AB, Jungwirth T Nature Materials, 10(5), 347, 2011 |
8 |
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space Holy V, Mundboth K, Mokuta C, Metzger TH, Stangl J, Bauer G, Boeck T, Schmidbauer M Thin Solid Films, 516(22), 8022, 2008 |
9 |
Composition and atomic ordering of Ge/Si(001) wetting layers Malachias A, Metzger TH, Stoffel M, Schmidt OG, Holy V Thin Solid Films, 515(14), 5587, 2007 |
10 |
Changes in the shapes of self-organized PbSe quantum dots during PbEuTe overgrowth investigated by anomalous X-ray diffraction Holy V, Schulli TU, Lechner RT, Springholz G, Bauer G Applied Surface Science, 253(1), 177, 2006 |