검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Conductive-probe AFM characterization of graphene sheets bonded to gold surfaces Hauquier F, Alamarguy D, Viel P, Noel S, Filoramo A, Huc V, Houze F, Palacin S Applied Surface Science, 258(7), 2920, 2012 |
| 2 |
Correlation between structural and transport properties of silicon thin films deposited at various substrate temperatures Roy D, Das C, Longeaud C, Houze F, Ray S Journal of Vacuum Science & Technology B, 21(3), 1048, 2003 |
| 3 |
Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy Schneegans O, Boyer L, Houze F, Meyer R, Chretien P Journal of Vacuum Science & Technology B, 20(5), 1929, 2002 |
| 4 |
The poly(ethylene terephthalate)/polyaniline composite: AFM, DRS and EPR investigations of some doping effects Pud AA, Tabellout M, Kassiba A, Korzhenko AA, Rogalsky SP, Shapoval GS, Houze F, Schneegans O, Emery JR Journal of Materials Science, 36(14), 3355, 2001 |
| 5 |
Conducting probe-mediated electrochemical nanopatterning of molecular materials Schneegans O, Moradpour A, Houze F, Angelova A, de Villeneuve CH, Allongue P, Chretien P Journal of the American Chemical Society, 123(46), 11486, 2001 |
| 6 |
Electronic and topographic properties of amorphous and microcrystalline silicon thin films Kleider JP, Longeaud C, Bruggemann R, Houze F Thin Solid Films, 383(1-2), 57, 2001 |
| 7 |
Apparent tunnel barrier heights of Ptlr-Au interfaces in relation to the Au surface composition Boyer L, Noel S, Houze F Journal of Vacuum Science & Technology B, 16(4), 2006, 1998 |
| 8 |
Atomic-Force Microscopy Study of the Topographic Evolution of Polyacrylonitrile Thin-Films Submitted to a Rapid Thermal-Treatment Newton P, Houze F, Guessab S, Noel S, Boyer L, Lecayon G, Viel P Thin Solid Films, 303(1-2), 200, 1997 |