화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 TTC39B deficiency stabilizes LXR reducing both atherosclerosis and steatohepatitis
Hsieh J, Koseki M, Molusky MM, Yakushiji E, Ichi I, Westerterp M, Iqbal J, Chan RB, Abramowicz S, Tascau L, Takiguchi S, Yamashita S, Welch CL, Di Paolo G, Hussain MM, Lefkowitch JH, Rader DJ, Tall AR
Nature, 535(7611), 303, 2016
2 Neural Stem Cells, Excited
Hsieh J, Schneider JW
Science, 339(6127), 1534, 2013
3 Melanopsin signalling in mammalian iris and retina
Xue T, Do MTH, Riccio A, Jiang Z, Hsieh J, Wang HC, Merbs SL, Welsbie DS, Yoshioka T, Weissgerber P, Stolz S, Flockerzi V, Freichel M, Simon MI, Clapham DE, Yau KW
Nature, 479(7371), 67, 2011
4 Comparative study between erbium and erbium oxide-doped diamondlike carbon films deposited by pulsed laser deposition technique
Foong YM, Hsieh J, Li X, Chua DHC
Journal of Vacuum Science & Technology A, 28(3), 449, 2010
5 Electron emission studies of CNTs grown on Ti and Ni containing amorphous carbon nanocomposite films
Koh ATT, Hsieh J, Chua DHC
Applied Surface Science, 256(1), 178, 2009
6 Experimental and modeling of carbonate formation in the effluent of oxygen delignification
Zhang DC, Hsieh J, Chai XS, Ragauskas AJ
AIChE Journal, 53(3), 669, 2007
7 Writing and erasing efficiency analysis on optical-storage media using scanning surface potential microscopy
Chen SH, Hou SP, Hsieh J'H, Chen HK, Tsai DP
Journal of Vacuum Science & Technology A, 24(6), 2003, 2006
8 MOCVD growth of highly strained InGaAs : Sb-GaAs-GaAsP quantum well vertical cavity surface-emitting lasers with 1.27 mu m emission
Kuo HC, Yao HH, Chang YH, Chang YA, Tsai MY, Hsieh J, Chang EY, Wang SC
Journal of Crystal Growth, 272(1-4), 538, 2004
9 Properties and gap-fill capability of HPD-CVD phosphosilicate glass films for subquarter-micrometer ULSI device technology
Vassiliev VY, Lin C, Fung D, Hsieh J, Sudijono JL
Electrochemical and Solid State Letters, 3(2), 80, 2000
10 Improvement of Adhesion Properties of Fluorinated Silica Glass-Films by Nitrous-Oxide Plasma Treatment
Swope R, Yoo WS, Hsieh J, Shuchmann S, Nagy F, Nijenhuis HT, Mordo D
Journal of the Electrochemical Society, 144(7), 2559, 1997