1 |
Removal of the heavy metal ion nickel (II) via an adsorption method using flower globular magnesium hydroxide Jiang DM, Yang YH, Huang CT, Huang MY, Chen JJ, Rao TD, Ran XY Journal of Hazardous Materials, 373, 131, 2019 |
2 |
Angular/linear-shaped indacenodithiophene (IDT) for donor-acceptor copolymers: Geometric shape effects on physical properties and photovoltaic performance Huang HY, Du ZR, Huang CT, Zhang J, Liu SL, Fu NN, Zhao BM, Yang RQ, Huang W Polymer, 162, 11, 2019 |
3 |
Small P particles formed by the Taiwan-native norovirus P domain overexpressed in Komagataella pastoris Chen YL, Chang PJ, Huang CT Applied Microbiology and Biotechnology, 102(22), 9707, 2018 |
4 |
Simulation prediction of the fiber breakage history in regular and barrier structure screws in injection molding Huang CT, Tseng HC Polymer Engineering and Science, 58(4), 452, 2018 |
5 |
A simple coating method to prepare superhydrophobic layers on ceramic alumina for vacuum membrane distillation Huang CY, Ko CC, Chen LH, Huang CT, Tung KL, Liao YC Separation and Purification Technology, 198, 79, 2018 |
6 |
Stress stimuli induce cancer-sternness gene expression via Sp1 activation leading to therapeutic resistance in glioblastoma Chang KY, Huang CT, Hsu TI, Hsu CC, Liu JJ, Chuang CK, Hung JJ, Chang WC, Tsai KK, Chuang JY Biochemical and Biophysical Research Communications, 493(1), 14, 2017 |
7 |
Melt Creep Recovery of Polyamide 6 and Polypropylene Nanocomposites Blended with Layered Silicate Lin GG, Jian YFJ, Huang CT International Polymer Processing, 31(1), 11, 2016 |
8 |
Effect of Peptide Sequences on Supramolecular Interactions of Naphthaleneimide/Tripeptide Conjugates Yeh MY, Huang CT, Lai TS, Chen FY, Chu NT, Tseng DTH, Hung SC, Lin HC Langmuir, 32(30), 7630, 2016 |
9 |
Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs Lin CY, Chang TC, Liu KJ, Tsai JY, Chen CE, Liu HW, Lu YH, Tseng TY, Cheng O, Huang CT Thin Solid Films, 620, 30, 2016 |
10 |
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors Lu YH, Chang TC, Ho SH, Chen CE, Tsai JY, Liu KJ, Liu XW, Lin CY, Tseng TY, Cheng O, Huang CT, Yen WT Thin Solid Films, 620, 43, 2016 |