검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
dc and low frequency noise analysis of Fowler-Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology Armand J, Martinez F, Benoit P, Valenza M, Vincent E, Huard V, Rochereau K Journal of Vacuum Science & Technology B, 27(3), 1129, 2009 |
| 2 |
65 nm LP/GP mix low cost platform for multi-media wireless and consumer applications Tavel B, Duriez B, Gwoziecki R, Basso MT, Julien C, Ortolland C, Laplanche Y, Fox R, Sabouret E, Detcheverry C, Boeuf F, Morin P, Barge D, Bidaud M, Bienacel J, Garnier P, Cooper K, Chapon JD, Trouiller Y, Belledent J, Broekaart M, Gouraud P, Denais M, Huard V, Rochereau K, Difrenza R, Planes N, Marin M, Boret S, Gloria D, Vanbergue S, Abramowitz P, Vishnubhotla L, Reber D, Stolk P, Woo M, Arnaud F Solid-State Electronics, 50(4), 573, 2006 |