검색결과 : 17건
| No. | Article |
|---|---|
| 1 |
Ellipsometry of surface layers on a 1-kg sphere from natural silicon Klenovsky P, Zuda J, Klapetek P, Humlicek J Applied Surface Science, 421, 542, 2017 |
| 2 |
Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures Wang CN, Caha O, Munz F, Kostelnik P, Novak T, Humlicek J Applied Surface Science, 421, 859, 2017 |
| 3 |
Infrared ellipsometry of highly oriented pyrolytic graphite Humlicek J, Nebojsa A, Munz F, Miric M, Gajic R Thin Solid Films, 519(9), 2624, 2011 |
| 4 |
Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials Humlicek J Thin Solid Films, 519(9), 2655, 2011 |
| 5 |
Optimized calibration and measurement procedures in rotating analyzer and rotating polarizer ellipsometry Munz F, Humlicek J, Marsik P Thin Solid Films, 519(9), 2703, 2011 |
| 6 |
Effect of Fe doping on optical properties of freestanding semi-insulating HVPE GaN:Fe Gladkov P, Humlicek J, Hulicius E, Simecek T, Paskova T, Evans K Journal of Crystal Growth, 312(8), 1205, 2010 |
| 7 |
Lateral-shape of InAs/GaAs quantum dots in vertically correlated structures Hospodkova A, Krapek V, Mates T, Kuldova K, Pangrac J, Hulicius E, Oswald J, Melichar K, Humlicek J, Simecek T Journal of Crystal Growth, 298, 570, 2007 |
| 8 |
Spectroscopic ellipsometry as a tool for on-line monitoring and control of surface treatment processes Eitzinger C, Fikar J, Forsich C, Humlicek J, Kruger A, Kullmer R, Laimer J, Lingenhole E, Muhlberger M, Muller T, Stori H, Wielsch U Materials Science Forum, 518, 423, 2006 |
| 9 |
3rd International Conference on Spectroscopic Ellipsometry, 2003 -Preface Fried M, Hingerl K, Humlicek J Thin Solid Films, 455-56, 1, 2004 |
| 10 |
Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high T-c superconductors Bernhard C, Humlicek J, Keimer B Thin Solid Films, 455-56, 143, 2004 |