검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Growth and characterization of an In0.53Ga0.47As-based Metal-Oxide-Semiconductor Capacitor (MOSCAP) structure on 300 mm on-axis Si (001) wafers by MOCVD Orzali T, Vert A, Kim TW, Hung PY, Herman JL, Vivekanand S, Huang GS, Kelman M, Karim Z, Hill RJW, Rao SSP Journal of Crystal Growth, 427, 72, 2015 |
| 2 |
Evaluation of sampling techniques for detection and quantification of airborne legionellae at biological aeration basins and shower rooms Chang CW, Hung PY Journal of Aerosol Science, 48, 63, 2012 |
| 3 |
Impact of Oxygen on Work Function of Ru Oxide Metal Gate Park CS, Bersuker G, Hung PY, Kirsch PD, Jammy R Electrochemical and Solid State Letters, 13(4), H105, 2010 |
| 4 |
Evaluation of bioaerosol sampling techniques for Legionella pneumophila coupled with culture assay and quantitative PCR Chang CW, Chou FC, Hung PY Journal of Aerosol Science, 41(12), 1055, 2010 |
| 5 |
Modified NiSi/Si Schottky Barrier Height by Nitrogen Implantation Kalra P, Vora N, Majhi P, Hung PY, Tseng HH, Jammy R, Liu TJK Electrochemical and Solid State Letters, 12(1), H1, 2009 |
| 6 |
A comparison of thickness values for very thin SiO2 films by using ellipsometric, capacitance-voltage, and HRTEM measurements Ehrstein J, Richter C, Chandler-Horowitz D, Vogel E, Young C, Shah S, Maher D, Foran B, Hung PY, Diebold A Journal of the Electrochemical Society, 153(1), F12, 2006 |
| 7 |
Application of x-ray metrology in the characterization of metal gate thin films Hung PY, Alshareef H, Lafford T, Bowen DK, Majhi P, Diebold A Journal of Vacuum Science & Technology B, 24(5), 2437, 2006 |
| 8 |
X-ray reflectometry and x-ray fluorescence monitoring of the atomic layer deposition process for high-k gate dielectrics Hung PY, Gondran C, Ghatak-Roy A, Terada S, Bunday B, Yeung H, Diebold A Journal of Vacuum Science & Technology B, 23(5), 2244, 2005 |
| 9 |
Growth mechanism of TiN film on dielectric films and the effects on the work function Choi K, Lysaght P, Alshareef H, Huffman C, Wen HC, Harris R, Luan H, Hung PY, Sparks C, Cruz M, Matthews K, Majhi P, Lee BH Thin Solid Films, 486(1-2), 141, 2005 |
| 10 |
SIMS depth profiling of advanced gate dielectric materials Bennett J, Gondran C, Sparks C, Hung PY, Hou A Applied Surface Science, 203, 409, 2003 |