검색결과 : 2건
No. | Article |
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1 |
Analysis of the formation of Ta2O5 passive films in acid media through mechanistic modeling Cabrera-Sierra R, Vazquez-Arenas J, Cardoso S, Luna-Sanchez RM, Trejo MA, Marin-Cruz J, Hallen JM Electrochimica Acta, 56(23), 8040, 2011 |
2 |
EIS characterization of tantalum and niobium oxide films based on a modification of the point defect model Cabrera-Sierra R, Hallen JM, Vazquez-Arenas J, Vazquez G, Gonzalez I Journal of Electroanalytical Chemistry, 638(1), 51, 2010 |