화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Analysis of the formation of Ta2O5 passive films in acid media through mechanistic modeling
Cabrera-Sierra R, Vazquez-Arenas J, Cardoso S, Luna-Sanchez RM, Trejo MA, Marin-Cruz J, Hallen JM
Electrochimica Acta, 56(23), 8040, 2011
2 EIS characterization of tantalum and niobium oxide films based on a modification of the point defect model
Cabrera-Sierra R, Hallen JM, Vazquez-Arenas J, Vazquez G, Gonzalez I
Journal of Electroanalytical Chemistry, 638(1), 51, 2010