화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Stacking, polarization control, and lasing (1.55 mu m region) InAs/InGaAsP/InP (100) quantum dots
Anantathanasarn S, Notzel R, van Veldhoven PJ, van Otten FWM, Eijkemans TJ, Barbarin Y, de Vries T, Smalbrugge E, Geluk EJ, Bente E, Oei YS, Smit MK, Wolter JH
Journal of Crystal Growth, 298, 553, 2007
2 Selective etching of n-InP(100) triggered at surface dislocations induced by nanoscratching
Gassilloud R, Michler J, Ballif C, Gasser P, Schmuki P
Electrochimica Acta, 51(11), 2182, 2006
3 Pore initiation and growth on n-InP(100)
Schmuki P, Schlierf U, Herrmann T, Champion G
Electrochimica Acta, 48(9), 1301, 2003
4 Angle resolved photoemission spectroscopy of the InP(001) surface
Frisch AM, Vogt P, Visbeck S, Hannappel T, Willig F, Braun W, Richter W, Bernholc J, Schmidt WG, Esser N
Applied Surface Science, 166(1-4), 224, 2000
5 On the theory of electron transfer reactions at semiconductor electrode/liquid interfaces
Gao YQ, Georgievskii Y, Marcus RA
Journal of Chemical Physics, 112(7), 3358, 2000
6 Reflectance anisotropy spectra for the transition from the P-rich to the In-rich surface reconstruction of InP(100)
Hannappel T, Visbeck S, Zorn M, Zettler JT, Willig F
Journal of Crystal Growth, 221, 124, 2000
7 Disappearance of element-specific Kikuchi bands from fluoride surfaces
Omori S, Nihei Y
Journal of Vacuum Science & Technology A, 17(4), 1626, 1999
8 Electrical properties of ion beam sputtered and ion assisted SiO2, SiOxNy, and SiNx films on silicon
Lambrinos MF, Valizadeh R, Colligon JS
Journal of Vacuum Science & Technology B, 16(2), 589, 1998
9 Silicon Dioxide Passivation of in P/InGaAs Metal-Semiconductor-Metal Photodetectors
Kollakowski S, Schade U, Bottcher EH, Kuhl D, Bimberg D, Ambree P, Wandel K
Journal of Vacuum Science & Technology B, 14(3), 1712, 1996
10 Electrical Behavior of Epitaxial SrF2/InP(100) Diodes
Mombelli B, Elfajiri A, Couturier G, Barriere AS
Thin Solid Films, 256(1-2), 80, 1995