검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
IR-Mueller matrix ellipsometry of self-assembled nanopatterned gold grid polarizer Peinado A, Kildemo M, Aas LMS, Martella C, Giordano MC, Chiappe D, de Mongeot FB, Borondics F, Garcia-Caurel E Applied Surface Science, 421, 728, 2017 |
| 2 |
Responsive Polymer-Electrode Interface-Study of its Thermo- and pH-Sensitivity and the Influence of Peptide Coupling Fandrich A, Buller J, Memczak H, Stocklein W, Hinrichs K, Wischerhoff E, Schulz B, Laschewsky A, Lisdat F Electrochimica Acta, 229, 325, 2017 |
| 3 |
Infrared ellipsometry as an investigation tool of thin layers grown into plasma immersion N+ implanted silicon Gartner M, Szekeres A, Alexandrova S, Osiceanu P, Anastasescu M, Stoica M, Marin A, Vlaikova E, Halova E Applied Surface Science, 258(18), 7195, 2012 |
| 4 |
Adsorption characteristics of aliphatic dithiols on silver and gold revealed by ellipsometry and FT-IR spectroscopy Joo SW, Han SW, Kim K Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals, 371, 355, 2001 |
| 5 |
Surface reaction processes in C4F8 and C5F8 plasmas for selective etching of SiO2 over photo-resist Motomura H, Imai S, Tachibana K Thin Solid Films, 390(1-2), 134, 2001 |
| 6 |
Difference between C4F8 and C5F8 plasmas in surface reaction processes for selective etching of SiO2 over Si3N4 Motomura H, Imai S, Tachibana K Thin Solid Films, 374(2), 243, 2000 |
| 7 |
Infrared ellipsometric analysis of organic film-on-substrate samples Roseler A, Korte EH Thin Solid Films, 313-314, 708, 1998 |