검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Post annealing effect on ultra-thin Hf-based high-k gate oxides on Si Kim JH, Ignatova VA, Kucher P, Weisheit M, Zschech E Current Applied Physics, 9(2), E104, 2009 |
| 2 |
Depth profiling of ZrO2/SiO2/Si stacks - a TOF-SIMS and computer simulation study Ignatova VA, Conard T, Moller W, Vandervorst W, Gijbels R Applied Surface Science, 231-2, 603, 2004 |