검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Effect of boron on gate oxide degradation and reliability in PMOS devices Brozek T, Kyono C, Ilderem V Solid-State Electronics, 45(8), 1293, 2001 |
| No. | Article |
|---|---|
| 1 |
Effect of boron on gate oxide degradation and reliability in PMOS devices Brozek T, Kyono C, Ilderem V Solid-State Electronics, 45(8), 1293, 2001 |