검색결과 : 2건
No. | Article |
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1 |
Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray Chu YS, Tkachuk A, Vogt S, Ilinski P, Walko DA, Mancini DC, Dufresne EM, He L, Tsui F Applied Surface Science, 223(1-3), 175, 2004 |
2 |
Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam Vogt S, Chu YS, Tkachuk A, Ilinski P, Walko DA, Tsui F Applied Surface Science, 223(1-3), 214, 2004 |