검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Thickness dependent integrity of gate oxide on SOI Tsujiuchi M, Iwamatsu T, Naruoka H, Umeda H, Ipposhi T, Maegawa S, Inoue Y Applied Surface Science, 216(1-4), 329, 2003 |
| 2 |
Evaluation of surface defects on SIMOX and their influences on device characteristics Naruoka H, Iwamatsu T, Tanaka T, Hattori N, Ipposhi T, Yamamoto H, Mashiko Y, Sudo M, Nakai T Journal of Crystal Growth, 210(1-3), 40, 2000 |