화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories
Yamazaki S, Iwasaki TO, Hachiya S, Takahashi T, Takeuchi K
Solid-State Electronics, 121, 25, 2016
2 Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs
Tokutomi T, Tanakamaru S, Iwasaki TO, Takeuchi K
Solid-State Electronics, 111, 129, 2015
3 Array-level stability enhancement of 50 nm AlxOy ReRAM
Iwasaki TO, Ning SY, Yamazawa H, Takeuchi K
Solid-State Electronics, 114, 1, 2015
4 Evaluation of voltage vs. pulse width modulation and feedback during set/reset verify-programming to achieve 10 million cycles for 50 nm HfO2 ReRAM
Higuchi K, Takeuchi K, Iwasaki TO
Solid-State Electronics, 91, 67, 2014