검색결과 : 4건
No. | Article |
---|---|
1 |
A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories Yamazaki S, Iwasaki TO, Hachiya S, Takahashi T, Takeuchi K Solid-State Electronics, 121, 25, 2016 |
2 |
Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs Tokutomi T, Tanakamaru S, Iwasaki TO, Takeuchi K Solid-State Electronics, 111, 129, 2015 |
3 |
Array-level stability enhancement of 50 nm AlxOy ReRAM Iwasaki TO, Ning SY, Yamazawa H, Takeuchi K Solid-State Electronics, 114, 1, 2015 |
4 |
Evaluation of voltage vs. pulse width modulation and feedback during set/reset verify-programming to achieve 10 million cycles for 50 nm HfO2 ReRAM Higuchi K, Takeuchi K, Iwasaki TO Solid-State Electronics, 91, 67, 2014 |