검색결과 : 5건
No. | Article |
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1 |
Filamentary resistive switching in amorphous and polycrystalline Nb2O5 thin films Mahne H, Berger L, Martin D, Klemm V, Slesazeck S, Jakschik S, Rafaja D, Mikolajick T Solid-State Electronics, 72, 73, 2012 |
2 |
Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation Roll G, Jakschik S, Burenkov A, Goldbach M, Mikolajick T, Frey L Solid-State Electronics, 65-66, 170, 2011 |
3 |
Mechanical stress in ALD-Al2O3 films Krautheim G, Hecht T, Jakschik S, Schroder U, Zahn W Applied Surface Science, 252(1), 200, 2005 |
4 |
Physical characterization of thin ALD-Al2O3 films Jakschik S, Schroeder U, Hecht T, Krueger D, Dollinger G, Bergmaier A, Luhmann C, Bartha JW Applied Surface Science, 211(1-4), 352, 2003 |
5 |
Crystallization behavior of thin ALD-Al2O3 films Jakschik S, Schroeder U, Hecht T, Gutsche M, Seidl H, Bartha JW Thin Solid Films, 425(1-2), 216, 2003 |