검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Repeating of positive and negative high electric field stress and corresponding thermal post-stress annealing of the n-channel power VDMOSFETs Aleksic SM, Jaksic AB, Pejovic MM Solid-State Electronics, 52(8), 1197, 2008 |
| 2 |
Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing Ristic GS, Pejovic MM, Jaksic AB Applied Surface Science, 252(8), 3023, 2006 |
| 3 |
Fowler-Nordheim high electric field stress of power VDMOSFETs Ristic GS, Pejovic MM, Jaksic AB Solid-State Electronics, 49(7), 1140, 2005 |
| 4 |
Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETs Ristic GS, Pejovic MM, Jaksic AB Applied Surface Science, 220(1-4), 181, 2003 |