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| No. | Article |
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| 1 |
Analyzing the current crowding effect induced by oxygen adsorption of amorphous InGaZnO thin film transistor by capacitance-voltage measurements Huang SY, Chang TC, Chen MC, Jian FY, Chen SC, Chen TC, Jheng JL, Lou MJ, Yeh FS Solid-State Electronics, 69, 11, 2012 |