화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs
Ioannidis EG, Dimitriadis CA, Haendler S, Bianchi RA, Jomaah J, Ghibaudo G
Solid-State Electronics, 76, 54, 2012
2 A unified short-channel compact model for cylindrical surrounding-gate MOSFET
Cousin B, Reyboz M, Rozeau O, Jaud MA, Ernst T, Jomaah J
Solid-State Electronics, 56(1), 40, 2011
3 Analytical unified threshold voltage model of short-channel FinFETs and implementation
Fasarakis N, Tsormpatzoglou A, Tassis DH, Dimitriadis CA, Papathanasiou K, Jomaah J, Ghibaudo G
Solid-State Electronics, 64(1), 34, 2011
4 Low frequency noise analysis in HfO2/SiO2 gate oxide fully depleted silicon on insulator transistors
Zafari L, Jomaah J, Ghibaudo G, Faynot O
Journal of Vacuum Science & Technology B, 27(1), 402, 2009
5 Impact of progressive oxide soft breakdown on metal oxide semiconductor parameters: Experiment and modeling
Gerrer L, Ribes G, Ghibaudo G, Jomaah J
Journal of Vacuum Science & Technology B, 27(1), 448, 2009
6 Low frequency noise in multi-gate SOICMOS devices
Zafari L, Jomaah J, Ghibaudo G
Solid-State Electronics, 51(2), 292, 2007
7 Polysilicon high frequency devices for large area electronics: Characterization, simulation and modeling
Botrel JL, Savry O, Rozeau O, Templier F, Jomaah J
Thin Solid Films, 515(19), 7422, 2007
8 An explicit analytical charge-based model of undoped independent double gate MOSFET
Reyboz M, Rozeau O, Poiroux T, Martin P, Jomaah J
Solid-State Electronics, 50(7-8), 1276, 2006
9 Coupling effects and channels separation in FinFETs
Dauge F, Pretet J, Cristoloveanu S, Vandooren A, Mathew L, Jomaah J, Nguyen BY
Solid-State Electronics, 48(4), 535, 2004
10 Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs
Dieudonne F, Haendler S, Jomaah J, Balestra F
Solid-State Electronics, 48(6), 985, 2004