검색결과 : 16건
No. | Article |
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1 |
Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs Ioannidis EG, Dimitriadis CA, Haendler S, Bianchi RA, Jomaah J, Ghibaudo G Solid-State Electronics, 76, 54, 2012 |
2 |
A unified short-channel compact model for cylindrical surrounding-gate MOSFET Cousin B, Reyboz M, Rozeau O, Jaud MA, Ernst T, Jomaah J Solid-State Electronics, 56(1), 40, 2011 |
3 |
Analytical unified threshold voltage model of short-channel FinFETs and implementation Fasarakis N, Tsormpatzoglou A, Tassis DH, Dimitriadis CA, Papathanasiou K, Jomaah J, Ghibaudo G Solid-State Electronics, 64(1), 34, 2011 |
4 |
Low frequency noise analysis in HfO2/SiO2 gate oxide fully depleted silicon on insulator transistors Zafari L, Jomaah J, Ghibaudo G, Faynot O Journal of Vacuum Science & Technology B, 27(1), 402, 2009 |
5 |
Impact of progressive oxide soft breakdown on metal oxide semiconductor parameters: Experiment and modeling Gerrer L, Ribes G, Ghibaudo G, Jomaah J Journal of Vacuum Science & Technology B, 27(1), 448, 2009 |
6 |
Low frequency noise in multi-gate SOICMOS devices Zafari L, Jomaah J, Ghibaudo G Solid-State Electronics, 51(2), 292, 2007 |
7 |
Polysilicon high frequency devices for large area electronics: Characterization, simulation and modeling Botrel JL, Savry O, Rozeau O, Templier F, Jomaah J Thin Solid Films, 515(19), 7422, 2007 |
8 |
An explicit analytical charge-based model of undoped independent double gate MOSFET Reyboz M, Rozeau O, Poiroux T, Martin P, Jomaah J Solid-State Electronics, 50(7-8), 1276, 2006 |
9 |
Coupling effects and channels separation in FinFETs Dauge F, Pretet J, Cristoloveanu S, Vandooren A, Mathew L, Jomaah J, Nguyen BY Solid-State Electronics, 48(4), 535, 2004 |
10 |
Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs Dieudonne F, Haendler S, Jomaah J, Balestra F Solid-State Electronics, 48(6), 985, 2004 |