화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 A proposal for bauxite quality control using the combined Rietveld - Le Bail - Internal Standard PXRD Method - Part 1: hkl model developed for kaolinite
Paz SPA, Kahn H, Angelica RS
Minerals Engineering, 118, 52, 2018
2 A proposal for bauxite quality control using the combined Rietveld - Le Bail - Internal Standard PXRD method - Part 2: Application to a gibbsitic bauxite from the Paragominas region, northern Brazil
Angelica RS, Kahn H, Paz SPA
Minerals Engineering, 122, 148, 2018
3 Optimization of the reactive silica quantification method applied to Paragominas-type gibbsitic bauxites
Paz SPA, Angelica RS, Kahn H
International Journal of Mineral Processing, 162, 48, 2017
4 Obtaining NiAl intermetallic compound using different milling devices
Kubaski ET, Cintho OM, Antoniassi JL, Kahn H, Capocchi JDT
Advanced Powder Technology, 23(5), 667, 2012
5 Electrostrictive stresses and breakdown of thin passive films on stainless steel
Heuer AH, Kahn H, Natishan PM, Martin FJ, Cross LE
Electrochimica Acta, 58, 157, 2011
6 Chloride Interactions with the Passive Films on Stainless Steel
Natishan PM, O'Grady WE, Martin FJ, Rayne RJ, Kahn H, Heuer AH
Journal of the Electrochemical Society, 158(2), C7, 2011
7 Carburization-Enhanced Passivity of PH13-8 Mo: A Precipitation-Hardened Martensitic Stainless Steel
Heuer AH, Kahn H, O'Donnell LJ, Ernst F, Michal GM, Rayne RJ, Martin FJ, Natishan PM
Electrochemical and Solid State Letters, 13(12), C37, 2010
8 Carburization-induced passivity of 316 L austenitic stainless steel
Martin FJ, Lemieux EJ, Newbauer TM, Bayles RA, Natishan PM, Kahn H, Michal GM, Ernst F, Heuerd AH
Electrochemical and Solid State Letters, 10(12), C76, 2007
9 Galvanic corrosion during processing of polysilicon microelectromechanical systems - The effect of Au metallization
Huh M, Yu Y, Kahn H, Payer JH, Heuer AH
Journal of the Electrochemical Society, 153(7), G644, 2006
10 Optimal design of multilayered polysilicon films for prescribed curvature
Ni A, Sherman D, Ballarini R, Kahn H, Mi B, Phillips SM, Heuer AH
Journal of Materials Science, 38(20), 4169, 2003