화학공학소재연구정보센터
검색결과 : 27건
No. Article
1 Observation of double Shockley stacking fault expansion in heavily-nitrogen-doped 4H-SiC using PL technique
Tokuda Y, Kamata I, Hoshino N, Kato T, Okumura H, Kimoto T, Tsuchida H
Journal of Crystal Growth, 468, 889, 2017
2 Fast growth of n-type 4H-SiC bulk crystal by gas-source method
Hoshino N, Kamata I, Tokuda Y, Makino E, Kanda T, Sugiyama N, Kuno H, Kojima J, Tsuchida H
Journal of Crystal Growth, 478, 9, 2017
3 Stable and high-speed SiC bulk growth without dendrites by the HTCVD method
Tokuda Y, Makino E, Sugiyama N, Kamata I, Hoshino N, Kojima J, Hara K, Tsuchida H
Journal of Crystal Growth, 448, 29, 2016
4 Deflection of threading dislocations in patterned 4H-SiC epitaxial growth
Tsuchida H, Takanashi R, Kamata I, Hoshino N, Makino E, Kojima J
Journal of Crystal Growth, 402, 260, 2014
5 Investigation of character and spatial distribution of threading edge dislocations in 4H-SiC epilayers by high-resolution topography
Kamata I, Nagano M, Tsuchida H, Chen Y, Dudley M
Journal of Crystal Growth, 311(5), 1416, 2009
6 Formation of basal plane Frank-type faults in 4H-SiC epitaxial growth
Tsuchida H, Kamata I, Nagano M
Journal of Crystal Growth, 310(4), 757, 2008
7 Investigation of defect formation in 4H-SiC epitaxial growth by X-ray topography and defect selective etching
Tsuchida H, Kamata I, Nagano M
Journal of Crystal Growth, 306(2), 254, 2007
8 Investigation of basal plane dislocations in the 4H-SiC epilayers grown on {0001} substrates
Tsuchida A, Miyanagi T, Kamata I, Nakamura T, Izumi K, Nakayama K, Ishii R, Asano K, Sugawara Y
Materials Science Forum, 483, 97, 2005
9 Structure of in-grown stacking faults in the 4H-SiC epitaxial layers
Izumi S, Tsuchida H, Tawara T, Kamata I, Izumi K
Materials Science Forum, 483, 323, 2005
10 Improvement in electrical performance of Schottky contacts for high-voltage diode
Nakamura T, Miyanagi T, Tsuchida H, Kamata I, Jikimoto T, Izumi K
Materials Science Forum, 483, 721, 2005