검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Extension of Far UV spectroscopic ellipsometry studies of High-kappa dielectric films to 130 nm Kamineni VK, Hilfiker JN, Freeouf JL, Consiglio S, Clark R, Leusink GJ, Diebold AC Thin Solid Films, 519(9), 2894, 2011 |
| 2 |
Investigation of optical properties of benzocyclobutene wafer bonding layer used for 3D interconnects via infrared spectroscopic ellipsometry Kamineni VK, Singh P, Kong LW, Hudnall J, Qureshi J, Taylor C, Rudack A, Arkalgud S, Diebold AC Thin Solid Films, 519(9), 2924, 2011 |
| 3 |
Dielectric properties and thickness metrology of strain engineered GaN/AlN/Si (111) thin films grown by MOCVD Tungare M, Kamineni VK, Shahedipour-Sandvik F, Diebold AC Thin Solid Films, 519(9), 2929, 2011 |
| 4 |
Layer-by-layer nanoassembly of polyelectrolytes using formamide as the working medium Kamineni VK, Lvov YM, Dobbins TA Langmuir, 23(14), 7423, 2007 |