검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Degradation evaluation of poly-Si TFTs by comparing normal and reverse characteristics and behavior analysis of hot-carrier degradation Kasakawa T, Tabata H, Onodera R, Kojima H, Kimura M, Hara H, Inoue S Solid-State Electronics, 56(1), 207, 2011 |