화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Cloning of the SPO11 gene that complements a meiotic recombination defect in sake yeast
Shimoi H, Kawamura N, Yamada M
Journal of Bioscience and Bioengineering, 130(4), 367, 2020
2 Meiotic chromosomal recombination defect in sake yeasts
Shimoi H, Hanazumi Y, Kawamura N, Yamada M, Shimizu S, Suzuki T, Watanabe D, Akao T
Journal of Bioscience and Bioengineering, 127(2), 190, 2019
3 Lengthening of high-yield production levels of monoclonal antibody-producing Chinese hamster ovary cells by downregulation of breast cancer 1
Matsuyama R, Yamano N, Kawamura N, Omasa T
Journal of Bioscience and Bioengineering, 123(3), 382, 2017
4 Characterization of cation-exchange membranes prepared from a graft-copolymer consisting of a polysulfone main chain and styrene sulfonic acid side chains
Kakihana Y, Ogawa Y, Takamura K, Kawamura N, Hara R, Higa M
Electrochimica Acta, 129, 120, 2014
5 CaFeO2: A New Type of Layered Structure with Iron in a Distorted Square Planar Coordination
Tassel C, Pruneda JM, Hayashi N, Watanabe T, Kitada A, Tsujimoto Y, Kageyama H, Yoshimura K, Takano M, Nishi M, Ohoyama K, Mizumaki M, Kawamura N, Iniguez J, Canadell E
Journal of the American Chemical Society, 131(1), 221, 2009
6 The coloration of tungsten-oxide film by oxygen deficiency and its mechanism
Sato R, Kawamura N, Tokumaru H
Applied Surface Science, 254(23), 7676, 2008
7 Enhancement of optical second harmonic generation by nitrogen adsorption on Cu(001)
Sano H, Miyaoka M, Iimori T, Sakiba D, Nakatsuji K, Wolf W, Podloucky R, Kawamura N, Mizutani G, Komori F
Applied Surface Science, 255(5), 3289, 2008
8 X-ray magnetic circular dichroism of size-selected, thiolated gold clusters
Negishi Y, Tsunoyama H, Suzuki M, Kawamura N, Matsushita MM, Maruyama K, Sugawara T, Yokoyama T, Tsukuda T
Journal of the American Chemical Society, 128(37), 12034, 2006
9 Magnetic properties of Co nano-dot arrays on vicinal Cu(001)-c(2x2)N surfaces
Miyaoka H, Kawamura N, Iimoni T, Komori F
Thin Solid Films, 464-65, 260, 2004
10 Experimental study of the degradation of mechanical strength of silicon wafers caused by large scale integration processes
Yagishita A, Fujii O, Numano M, Kawamura N, Iwase M, Ushiku Y, Arikado T
Journal of the Electrochemical Society, 145(9), 3160, 1998