검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
High speed Bias Temperature Instability measurements on 20 nm RMG HKMG MOSFETs Chandra N, Chandrashekhar S, Francis R, Kerber A, Srinivasan P, Nigam T Solid-State Electronics, 101, 18, 2014 |
| 2 |
Thermal Stability of Copper Contact Metallization Using Ru-Containing Liner Seo SC, Yang CC, Hu CK, Kerber A, Fan S, Horak D, Canaperi D, Rao SP, Haran B, Doris B Electrochemical and Solid State Letters, 14(5), H187, 2011 |