화학공학소재연구정보센터
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No. Article
1 Optical and electrical characteristics of plasma enhanced chemical vapor deposition boron carbonitride thin films derived from N-trimethylborazine precursor
Sulyaeva VS, Kosinova ML, Rumyantsev YM, Kuznetsov FA, Kesler VG, Kirienko VV
Thin Solid Films, 558, 112, 2014
2 Electronic structure and vibrational properties of KRbAl2B2O7
Atuchin VV, Adichtchev SV, Bazarov BG, Bazarova ZG, Gavrilova TA, Grossman VG, Kesler VG, Meng GS, Lin ZS, Surovtsev NV
Materials Research Bulletin, 48(3), 929, 2013
3 Electronic parameters and top surface chemical stability of RbPb2Br5
Atuchin VV, Isaenko LI, Kesler VG, Pokrovsky LD, Tarasova AY
Materials Chemistry and Physics, 132(1), 82, 2012
4 Single crystal growth and surface chemical stability of KPb2Br5
Atuchin VV, Isaenko LI, Kesler VG, Tarasova AY
Journal of Crystal Growth, 318(1), 1000, 2011
5 Composition, morphology and surface recombination rate of HCl-isopropanol treated and vacuum annealed InAs(111)A surfaces
Kesler VG, Seleznev VA, Kovchavtsev AP, Guzev AA
Applied Surface Science, 256(14), 4626, 2010
6 Low-temperature synthesis and structural properties of ferroelectric K3WO3F3 elpasolite
Atuchin VV, Gavrilova TA, Kesler VG, Molokeev MS, Aleksandrov KS
Chemical Physics Letters, 493(1-3), 83, 2010
7 Etching and oxidation of InAs in planar inductively coupled plasma
Dultsev FN, Kesler VG
Applied Surface Science, 256(1), 246, 2009
8 Pulsed ion-beam assisted deposition of Ge nanocrystals on SiO(2) for non-volatile memory device
Stepina NP, Dvurechenskii AV, Armbrister VA, Kirienko VV, Novikov PL, Kesler VG, Gutakovskii AK, Smagina ZV, Spesivtzev EV
Thin Solid Films, 517(1), 313, 2008
9 Growth and surface characterization of sputter-deposited molybdenum oxide thin films
Ramana CV, Atuchin VV, Kesler VG, Kochubey VA, Pokrovsky LD, Shutthanandan V, Becker U, Ewing RC
Applied Surface Science, 253(12), 5368, 2007
10 X-ray photoelectron spectroscopy study of beta-BaB2O4 optical surface
Atuchin VV, Kesler VG, Kokh AE, Pokrovsky LD
Applied Surface Science, 223(4), 352, 2004