검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Improved determination of phosphorus contamination during ion implantation by SRP and simulations Kuruc M, Hulenyi L, Kinder R Applied Surface Science, 255(18), 8110, 2009 |
| 2 |
Determination of phosphorus contamination during antimony implantation by measurement and simulation Kuruc M, Hulenyi L, Kinder R Applied Surface Science, 252(12), 4353, 2006 |
| 3 |
MOVPE technology and characterisation of silicon delta-doped GaAs and AlxGa1-xAs Sciana B, Radziewicz D, Paszkiewicz B, Tlaczala M, Utko M, Sitarek P, Sek G, Misiewicz J, Kinder R, Kovac J, Srnanek R Thin Solid Films, 412(1-2), 55, 2002 |
| 4 |
Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy Srnanek R, Kinder R, Sciana B, Radziewicz D, McPhail DS, Littlewood SD, Novotny I Applied Surface Science, 177(1-2), 139, 2001 |