검색결과 : 20건
| No. | Article |
|---|---|
| 1 |
Nature of the filament formed in HfO2-based resistive random access memory De Stefano F, Houssa M, Afanas'ev VV, Kittl JA, Jurczak M, Stesmans A Thin Solid Films, 533, 15, 2013 |
| 2 |
Thermal-stability optimization of Al2O3/Cu-Te based conductive-bridging random access memory systems Goux L, Opsomer K, Franquet A, Kar G, Jossart N, Richard O, Wouters DJ, Muller R, Detavernier C, Jurczak M, Kittl JA Thin Solid Films, 533, 29, 2013 |
| 3 |
Electron barrier height at CuxTe1-x/Al2O3 interfaces of conducting bridge memory stacks Afanas'ev VV, De Stefano F, Houssa M, Stesmans A, Goux L, Opsomer K, Detavernier C, Kittl JA, Jurczak M Thin Solid Films, 533, 34, 2013 |
| 4 |
Roles and Effects of TiN and Pt Electrodes in Resistive-Switching HfO2 Systems Goux L, Wang XP, Chen YY, Pantisano L, Jossart N, Govoreanu B, Kittl JA, Jurczak M, Altimime L, Wouters DJ Electrochemical and Solid State Letters, 14(6), H244, 2011 |
| 5 |
Lanthanide Aluminates as Dielectrics for Non-Volatile Memory Applications: Material Aspects Adelmann C, Swerts J, Richard O, Conard T, Popovici M, Meersschaut J, Afanas'ev VV, Breuil L, Cacciato A, Opsomer K, Brijs B, Tielens H, Pourtois G, Bender H, Jurczak M, Van Houdt J, Van Elshocht S, Kittl JA Journal of the Electrochemical Society, 158(8), H778, 2011 |
| 6 |
Rare-earth aluminates as a charge trapping materials for NAND flash memories: Integration and electrical evaluation Suhane A, Cacciato A, Richard O, Arreghini A, Adelmann C, Swerts J, Rothschild O, Van den Bosch G, Breuil L, Bender H, Jurczak M, Debusschere I, Kittl JA, De Meyer K, Van Houdt J Solid-State Electronics, 65-66, 177, 2011 |
| 7 |
Effect of the composition on the bandgap width of high-kappa MexTiyOz (Me = Hf, Ta, Sr) layers Wang WC, Badylevich M, Afanas'ev VV, Stesmans A, Popovici M, Tomida K, Menou N, Kittl JA, Lukosius M, Kaynak CB, Wenger C Thin Solid Films, 519(17), 5730, 2011 |
| 8 |
Atomic Layer Deposition of Strontium Titanate Films Using Sr((Bu3Cp)-Bu-t)(2) and Ti(OMe)(4) Popovici M, Van Elshocht S, Menou N, Swerts J, Pierreux D, Delabie A, Brijs B, Conard T, Opsomer K, Maes JW, Wouters DJ, Kittl JA Journal of the Electrochemical Society, 157(1), G1, 2010 |
| 9 |
Properties of Ultrathin High Permittivity (Nb1-xTax)(2)O-5 Films Prepared by Aqueous Chemical Solution Deposition Hardy A, Van Elshocht S, Dewulf D, Clima S, Peys N, Adelmann C, Opsomer K, Favia P, Bender H, Hoflijk I, Conard T, Franquet A, Van den Rul H, Kittl JA, De Gendt S, Van Bael MK, Mullens J Journal of the Electrochemical Society, 157(1), G13, 2010 |
| 10 |
Dielectric Response of Ta2O5, Nb2O5, and NbTaO5 from First-Principles Investigations Clima S, Pourtois G, Hardy A, Van Elshocht S, Van Bael MK, De Gendt S, Wouters DJ, Heyns M, Kittl JA Journal of the Electrochemical Society, 157(1), G20, 2010 |