검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
SCALPEL mark detection using Si/SiO2 and 100 keV backscattered electrons Farrow RC, Mkrtchyan M, Kizilyalli IC, Waskiewicz WK, Hopkins LC, Alakan A, Gibson G, Brown P, Misra S, Trimble L Journal of Vacuum Science & Technology B, 19(5), 1852, 2001 |
| 2 |
Implementing advanced lithography technology: A 100 MHz, 1 V digital signal processor fabricated with phase shifted gates Watson GP, Kizilyalli IC, Nalamasu O, Cirelli RA, Miller M, Wang Y, Pati B, Radosevich J, Kohler R, Freyman R, Klemens F, Mansfield W, Vaidya H, Timko A, Trimble L, Frackoviak J Journal of Vacuum Science & Technology B, 18(6), 2877, 2000 |