검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Determination of Generation Lifetime in Trap-Rich and Layered Semiconductors by Metal-Oxide-Semiconductor Measurements Fahrner WR, Loffler S, Klausmann E, Neitzert HC Journal of the Electrochemical Society, 141(8), 2151, 1994 |
| 2 |
Metal-Oxide-Semiconductor Capacitance Measurements on Amorphous-Silicon Neitzert HC, Loffler S, Klausmann E, Fahrner WR Journal of the Electrochemical Society, 141(9), 2474, 1994 |