검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Spectroscopic ellipsometry of very thin tantalum pentoxide on Si Karmakov I, Konova A, Atanassova E, Paskaleva A Applied Surface Science, 255(22), 9211, 2009 |
| 2 |
Depth profile characterization of low-energy B+- and Ge+-ion-implanted Si Karmakov I, Chakarov I, Konova A Applied Surface Science, 211(1-4), 270, 2003 |