화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 The peculiarities of structural and optical properties of HfO2-based films co-doped with silicon and erbium
Khomenkova L, Korsunska N, Labbe C, Fortier X, Gourbilleau F
Applied Surface Science, 471, 521, 2019
2 Investigation of undoped and Tb-doped ZnO films on Al2O3 substrate by infrared reflection method
Melnichuk O, Melnichuk L, Tsykaniuk B, Tsybrii Z, Lytvyn P, Guillaume C, Portier X, Strelchuk V, Venger Y, Khomenkova L, Korsunska N
Thin Solid Films, 673, 136, 2019
3 The structure of Si-SiO2 layers with high excess Si content prepared by magnetron sputtering
Baran N, Bulakh B, Venger Y, Korsunska N, Khomenkova L, Stara T, Goldstein Y, Savir E, Jedrzejewski J
Thin Solid Films, 517(18), 5468, 2009
4 Depth redistribution of components of SiOx layers prepared by magnetron sputtering in the process of their decomposition
Khomenkova L, Korsunska N, Stara T, Venger Y, Sada C, Trave E, Goldstein Y, Jedrzejewski J, Savir E
Thin Solid Films, 515(17), 6749, 2007
5 Effect of growth temperature on the luminescent and structural properties of InGaAsSbN/GaAs quantum wells for 1.3 mu m telecom application
Borkovska L, Yefanov O, Gudymenko O, Johnson S, Kladko V, Korsunska N, Kryshtab T, Sadofyev Y, Zhang YH
Thin Solid Films, 515(2), 786, 2006
6 Raman scattering characterization of macro- and nanoporous silicon
Korsunska N, Bulakh B, Jumayev B, Khomenkova L, Yukhymchuk V, Torchynska T
Applied Surface Science, 243(1-4), 30, 2005