검색결과 : 6건
No. | Article |
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1 |
The peculiarities of structural and optical properties of HfO2-based films co-doped with silicon and erbium Khomenkova L, Korsunska N, Labbe C, Fortier X, Gourbilleau F Applied Surface Science, 471, 521, 2019 |
2 |
Investigation of undoped and Tb-doped ZnO films on Al2O3 substrate by infrared reflection method Melnichuk O, Melnichuk L, Tsykaniuk B, Tsybrii Z, Lytvyn P, Guillaume C, Portier X, Strelchuk V, Venger Y, Khomenkova L, Korsunska N Thin Solid Films, 673, 136, 2019 |
3 |
The structure of Si-SiO2 layers with high excess Si content prepared by magnetron sputtering Baran N, Bulakh B, Venger Y, Korsunska N, Khomenkova L, Stara T, Goldstein Y, Savir E, Jedrzejewski J Thin Solid Films, 517(18), 5468, 2009 |
4 |
Depth redistribution of components of SiOx layers prepared by magnetron sputtering in the process of their decomposition Khomenkova L, Korsunska N, Stara T, Venger Y, Sada C, Trave E, Goldstein Y, Jedrzejewski J, Savir E Thin Solid Films, 515(17), 6749, 2007 |
5 |
Effect of growth temperature on the luminescent and structural properties of InGaAsSbN/GaAs quantum wells for 1.3 mu m telecom application Borkovska L, Yefanov O, Gudymenko O, Johnson S, Kladko V, Korsunska N, Kryshtab T, Sadofyev Y, Zhang YH Thin Solid Films, 515(2), 786, 2006 |
6 |
Raman scattering characterization of macro- and nanoporous silicon Korsunska N, Bulakh B, Jumayev B, Khomenkova L, Yukhymchuk V, Torchynska T Applied Surface Science, 243(1-4), 30, 2005 |