검색결과 : 22건
No. | Article |
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1 |
Structure-morphology correlation in electrospun fibers of semicrystalline polymers by simultaneous synchrotron SAXS-WAXD Gazzano M, Gualandi C, Zucchelli A, Sui T, Korsunsky AM, Reinhard C, Focarete ML Polymer, 63, 154, 2015 |
2 |
A comparative transmission electron microscopy, energy dispersive x-ray spectroscopy and spatially resolved micropillar compression study of the yttria partially stabilised zirconia - porcelain interface in dental prosthesis Lunt AJG, Mohanty G, Ying S, Dluhos J, Sui T, Neo TK, Michler J, Korsunsky AM Thin Solid Films, 596, 222, 2015 |
3 |
Tensile secondary creep rate analysis of a dental veneering porcelain Lunt AJG, Kabra S, Kelleher J, Zhang SY, Neo TK, Korsunsky AM Thin Solid Films, 596, 269, 2015 |
4 |
A critical comparison between XRD and FIB residual stressmeasurement techniques in thin films Bemporad E, Brisotto M, Depero LE, Gelfi M, Korsunsky AM, Lunt AJG, Sebastiani M Thin Solid Films, 572, 224, 2014 |
5 |
Hierarchical modelling of elastic behaviour of human enamel based on synchrotron diffraction characterisation Sui T, Sandholzer MA, Baimpas N, Dolbnya IP, Landini G, Korsunsky AM Journal of Structural Biology, 184(2), 136, 2013 |
6 |
Ultrafast Three-Dimensional Imaging of Lattice Dynamics in Individual Gold Nanocrystals Clark JN, Beitra L, Xiong G, Higginbotham A, Fritz DM, Lemke HT, Zhu D, Chollet M, Williams GJ, Messerschmidt M, Abbey B, Harder RJ, Korsunsky AM, Wark JS, Robinson IK Science, 341(6141), 56, 2013 |
7 |
Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for d(o) evaluation Baimpas N, Le Bourhis E, Eve S, Thiaudiere D, Hardie C, Korsunsky AM Thin Solid Films, 549, 245, 2013 |
8 |
Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging Song X, Yeap KB, Zhu J, Belnoue J, Sebastiani M, Bemporad E, Zeng KY, Korsunsky AM Thin Solid Films, 520(6), 2073, 2012 |
9 |
Influence of Quenchant Hydrodynamics and Boiling Phase Incipient Temperature Shifts on Residual Stress Formation Vorster WJJ, Watt MWD, Venter AM, Oliver EC, Prakash DGL, Korsunsky AM Heat Transfer Engineering, 30(7), 564, 2009 |
10 |
The influence of indenter bluntness on the apparent contact stiffness of thin coatings Korsunsky AM, Constantinescu A Thin Solid Films, 517(17), 4835, 2009 |