화학공학소재연구정보센터
검색결과 : 19건
No. Article
1 Adsorption of the NH3, NO, NO2, CO2, and CO gas molecules on blue phosphorene: A first-principles study
Safari F, Moradinasab M, Fathipour M, Kosina H
Applied Surface Science, 464, 153, 2019
2 Consistent low-field mobility modeling for advanced MOS devices
Stanojevic Z, Baumgartner O, Filipovic L, Kosina H, Karner M, Kernstock C, Prause P
Solid-State Electronics, 112, 37, 2015
3 Bandstructure and mobility variations in p-type silicon nanowires under electrostatic gate field
Neophytou N, Baumgartner O, Stanojevic Z, Kosina H
Solid-State Electronics, 90, 44, 2013
4 Subband engineering in n-type silicon nanowires using strain and confinement
Stanojevic Z, Sverdlov V, Baumgartner O, Kosina H
Solid-State Electronics, 70, 73, 2012
5 Confinement-induced carrier mobility increase in nanowires by quantization of warped bands
Neophytou N, Kosina H
Solid-State Electronics, 70, 81, 2012
6 Graphene-Based Antidots for Thermoelectric Applications
Karamitaheri H, Pourfath M, Pazoki M, Faez R, Kosina H
Journal of the Electrochemical Society, 158(12), K213, 2011
7 Integration of MOSFETs with SiGe dots as stressor material
Nanver LK, Jovanovic V, Biasotto C, Moers J, Grutzmacher D, Zhang JJ, Hrauda N, Stoffel M, Pezzoli F, Schmidt OG, Miglio L, Kosina H, Marzegalli A, Vastola G, Mussler G, Stangl J, Bauer G, van der Cingel J, Bonera E
Solid-State Electronics, 60(1), 75, 2011
8 Strained MOSFETs on ordered SiGe dots
Cervenka J, Kosina H, Selberherr S, Zhang JJ, Hrauda N, Stangl J, Bauer G, Vastola G, Marzegalli A, Montalenti F, Miglio L
Solid-State Electronics, 65-66, 81, 2011
9 Electron subband structure in strained silicon UTB films from the Hensel-Hasegawa-Nakayama model - Part 2 efficient self-consistent numerical solution of the k . p schrodinger equation
Baumgartner O, Karner M, Sverdlov V, Kosina H
Solid-State Electronics, 54(2), 143, 2010
10 Two-band k center dot p model for the conduction band in silicon: Impact of strain and confinement on band structure and mobility
Sverdlov V, Karlowatz G, Dhar S, Kosina H, Selberherr S
Solid-State Electronics, 52(10), 1563, 2008