검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
High resolution Rutherford Backscattering Spectrometry investigations of ZrO2 layer growth in the initial stage on native silicon oxide and titanium nitride Vieluf M, Munnik F, Neelmeijer C, Kosmata M, Teichert S Thin Solid Films, 520(18), 5900, 2012 |