화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Sidegating mechanism as a function of the sidegate-to-channel spacing
Prokhorov EF, Gorev NB, Kodzhespirova IF, Kovalenko YA
Solid-State Electronics, 44(10), 1857, 2000
2 Nondestructive technique for the characterization of deep traps at interlayer interfaces in thin-film multilayer semiconductor structures
Gonzalez-Hernandez J, Prokhorov E, Gorev NB, Kodzhespirova IF, Kovalenko YA
Journal of Vacuum Science & Technology B, 17(5), 2357, 1999