화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(001) wafers
Meduna M, Kreiliger T, Mauceri M, Puglisi M, Mancarella F, La Via F, Crippa D, Miglio L, von Kanel H
Journal of Crystal Growth, 507, 70, 2019
2 Highly Mismatched, Dislocation-Free SiGe/Si Heterostructures
Isa F, Salvalaglio M, Dasilva YAR, Meduna M, Barget M, Jung A, Kreiliger T, Isella G, Erni R, Pezzoli F, Bonera E, Niedermann P, Groning P, Montalenti F, von Kanel H
Advanced Materials, 28(5), 884, 2016
3 3D heteroepitaxy of mismatched semiconductors on silicon
Falub CV, Kreiliger T, Isa F, Taboada AG, Meduna M, Pezzoli F, Bergamaschini R, Marzegalli A, Muller E, Chrastina D, Isella G, Neels A, Niedermann P, Dommann A, Miglio L, von Kanel H
Thin Solid Films, 557, 42, 2014