검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Determination of interface growth with atomic resolution in FeCo-Si multilayers Cho SJ, Krist T, Mezei F Thin Solid Films, 434(1-2), 136, 2003 |
| 2 |
Dependence of interface layer thickness in FeCo-Si multilayers on sputtering parameters Cho SJ, Krist T, Mezei F Thin Solid Films, 444(1-2), 158, 2003 |